发明名称 MOS transistor adopting titanium-carbon-nitride gate electrode and manufacturing method thereof
摘要 A MOS transistor employing a titanium-carbon-nitride (TiCN) gate electrode is provided. The MOS transistor has a gate insulating film, a gate electrode, and a source/drain region on a semiconductor substrate. The gate electrode is formed of a single TiCN film or a double film having a TiCN film and a low-resistant metal film formed thereon. The TiCN gate electrode exhibits a low resistance of about 80-100 mu OMEGA -cm and can control variations in Fermi energy level.
申请公布号 US5795817(A) 申请公布日期 1998.08.18
申请号 US19960619361 申请日期 1996.03.21
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JOO, SUK-HO;PAIK, CHOONG-RYUL;LEE, KI-HONG
分类号 H01L21/28;H01L29/49;H01L29/78;(IPC1-7):H01L21/28 主分类号 H01L21/28
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