发明名称 MEASURING METHOD FOR TEMPERATURE OF PAINT FILM BAKING
摘要 PROBLEM TO BE SOLVED: To measure the temperature of surfaces in a process of paint film baking. SOLUTION: Infrared rays of frequencies of or less than 2.2μm among those radiated from a painted plate are measured as objects to be measured by a radiation thermometer. At the time of measurement, a rod-shaped light source is used. A plane to be irradiated is scanned as rotating the light source. As flashing the light source, the intensity of reflection is measured at the time when the light source is on, and the intensity of radiation is measured at the time when it is off. The intensity of reflection is corrected by the infrared transmittance of a solvent, and a reflectance is obtained from the corrected intensity of reflection to calculate temperatures. In this way, as the infrared transmittances of general organic solvents are large at frequencies of or less than 2.2μm and stable, it is possible to measure temperatures with accuracy even in a baking furnace filled with solvents.
申请公布号 JPH10206238(A) 申请公布日期 1998.08.07
申请号 JP19970006363 申请日期 1997.01.17
申请人 NKK CORP 发明人 INOUE NORIO;MANABE TOSHIKI;YAMADA YOSHIRO
分类号 G01J5/00;B05D3/00;B05D3/02;G01J5/10;(IPC1-7):G01J5/00 主分类号 G01J5/00
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