发明名称 Process simulation apparatus and method for selecting an optimum simulation model for a semiconductor manufacturing process
摘要 A process simulation apparatus simulates a manufacturing process of a semiconductor device which manufacturing process comprising various processes including an ion implantation process and a diffusion process. Process sequence data which represents conditions of a two-dimensional simulation for each process is input to a memory unit. The memory unit stores the process sequence data and also stores condition information for various simulation models usable for each process. An optimum simulation model for each process is selected for performing a two-dimensional simulation for each process. The semiconductor device manufacturing process is simulated by a two-dimensional simulation method using the selected optimum simulation model.
申请公布号 US5787269(A) 申请公布日期 1998.07.28
申请号 US19950531231 申请日期 1995.09.19
申请人 RICOH COMPANY, LTD. 发明人 HYODO, TOSHIHIRO
分类号 H01L21/02;G06F11/26;G06F17/50;G06F19/00;G06Q50/00;G06Q50/04;H01L21/00;(IPC1-7):G06F11/30 主分类号 H01L21/02
代理机构 代理人
主权项
地址
您可能感兴趣的专利