发明名称 Method for fabricating a flash EEPROM
摘要 A method for forming a floating gate semiconductor device such as an electrically erasable programmable read only memory is provided. The device includes a silicon substrate having an electrically isolated active area. A gate oxide, as well as other components of a FET (e.g., source, drain) are formed in the active area. A self aligned floating gate is formed by depositing a conductive layer (e.g., polysilicon) into the recess and over the gate oxide. The conductive layer is then chemically mechanically planarized to an endpoint of the isolation layer so that all of the conductive layer except material in the recess and on the gate oxide is removed. Following formation of the floating gate an insulating layer is formed on the floating gate and a control gate is formed on the insulating layer.
申请公布号 US5767005(A) 申请公布日期 1998.06.16
申请号 US19950532997 申请日期 1995.09.25
申请人 MICRON TECHNOLOGY, INC. 发明人 DOAN, TRUNG TRI;LOWREY, TYLER A.
分类号 H01L21/28;H01L21/336;(IPC1-7):H01L21/824 主分类号 H01L21/28
代理机构 代理人
主权项
地址