CIRCUIT INSPECTION DEVICE AND PROBE DRIVING METHOD,申请号JP19960315153-传众专利搜索

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发明名称	CIRCUIT INSPECTION DEVICE AND PROBE DRIVING METHOD
摘要
申请公布号	JPH10153622(A)	申请公布日期	1998.06.09
申请号	JP19960315153	申请日期	1996.11.26
申请人	FUJI XEROX CO LTD	发明人	KUBODERA TADASHI
分类号	G01R1/06;G01R31/02;G01R31/28;G02F1/1333;(IPC1-7):G01R1/06;G02F1/133	主分类号	G01R1/06
代理机构		代理人
主权项
地址

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