发明名称 Over line scan method
摘要 This invention provides a method for scanning a thin film transistor liquid crystal display which eliminates the undesirable brightness fluctuations in the display due to parasitic capacitance. When conventional scanning methods are used in thin film transistor liquid crystal displays parasitic and other capacitances in the array cause fluctuations in brightness of the pixels. This method scans multiple rows of the display simultaneously and still eliminates the brightness fluctuations of the pixels.
申请公布号 US5742270(A) 申请公布日期 1998.04.21
申请号 US19960612619 申请日期 1996.03.06
申请人 INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE 发明人 KUO, FANG-CHIEN
分类号 G02F1/133;G09G3/36;H04N5/66;H04N7/00;(IPC1-7):H04N7/00 主分类号 G02F1/133
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