发明名称 Automatic generation of test drivers
摘要 <p>A test driver generator is provided for generating test drivers. The test driver generator receives test expressions designating execution sequences of test functions of software interfaces and corresponding attribute value specifications for the designated test functions' parameter attributes. Each test expression designating a number of test functions to be executed in a certain sequence, and each corresponding attribute value specification specifies selected attribute values of the test functions' parameter attributes. For each test expression and corresponding attribute value specifications of a software interface, the test driver generator, in response, generates a test driver that can execute the specified test functions in the designated order with all combinations of the selected attribute values of the test functions' parameter attributes. &lt;IMAGE&gt;</p>
申请公布号 EP0834810(A1) 申请公布日期 1998.04.08
申请号 EP19970307146 申请日期 1997.09.15
申请人 SUN MICROSYSTEMS, INC. 发明人 HAYES, ROGER
分类号 G06F11/36;(IPC1-7):G06F11/00 主分类号 G06F11/36
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