发明名称 Durable mask and method of fabrication
摘要 The durable mask includes a polyimide layer formed over a portion of a semiconductor substrate to be masked. A heavy metal layer is then formed over the polyimide layer. An adhesion layer is formed between the polyimide layer and the heavy metal layer to insure adhesion of the heavy metal layer to the polyimide layer. The durable mask may mask, for example, a heterojunction bipolar transistor formed in the semiconductor substrate prior to an ion implantation process. Furthermore, the mask is removed from the substrate by eliminating the adhesion between the mask and substrate or by dissolving the polyimide layer.
申请公布号 US5725786(A) 申请公布日期 1998.03.10
申请号 US19950560184 申请日期 1995.11.20
申请人 BAYRAKTAROGLU, BURHAN 发明人 BAYRAKTAROGLU, BURHAN
分类号 H01L21/266;H01L21/331;H01L21/76;(IPC1-7):G03F9/00 主分类号 H01L21/266
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