发明名称 BUMP FORMING GOLD ALLOY WIRE AND FORMING BUMPS
摘要 PROBLEM TO BE SOLVED: To hold a high bond, strength of an Au alloy wire and stably reduce the tail length caused by the simple tension even after exposure thereof at high temps. for a long time lapsed from forming of bumps on Al-based electrode pads by adding specified amt. of Pd and Bi to a high purity Au. SOLUTION: Pd and Bi are added 0.2-5.0wt.% and 1-100wt.ppm to a high purity Au of the alloy wire, or at least one of Y, La, Ca and Be is added 3-250 wt.ppm. A ball 4 is formed on the top end of an Au wire 2 passed through a capillary 1, the capillary is lowered to depress and bond the ball 4 to an electrode 5 of an IC chip 6, and the wire 2 is pulled up to separate the wire from the depressed ball 4', thereby forming an Au bump 4' for wireless bonding of the electrode 5 of the chip 6 to an outer lead. The Au alloy wire 2 is used in such case.
申请公布号 JPH09321076(A) 申请公布日期 1997.12.12
申请号 JP19960133546 申请日期 1996.05.28
申请人 TANAKA DENSHI KOGYO KK 发明人 AKIMOTO HIDEYUKI
分类号 H01L21/60;B23K20/00;B23K35/30;C22C5/02;H01L23/49 主分类号 H01L21/60
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