High resolution supply current test system

摘要

The present invention relates to a system for the measurement of a supply current of an electronic circuit, comprising: a first part with control means for applying and controlling at least one voltage and one current on said circuit; a second part being fed by an input voltage and delivering a first output voltage and a first output current on a first terminal and a second output current on a second terminal, said first output voltage being essentially equal to said input voltage, said second output current being essentially proportional to said first output current being said supply current; a switch in between said first and said second part, being controlled by trigger means controlled by said first part, for turning said switch off or on whereby switching said second part in measurement mode or in bypass mode. <IMAGE>