发明名称 MATERIAL FOR FORMING SILICA-BASE COATED INSULATION FILM, PROCESS FOR PRODUCING THE MATERIAL, SILICA-BASE INSULATION FILM, SEMICONDUCTOR DEVICE, AND PROCESS FOR PRODUCING THE DEVICE
摘要 <p>A material for forming silica-base coated insulation films used to form interlayer insulation films of multi-layer interconnection in VLSIs is provided. A material for forming a silica-base coated insulation film, obtained from (a) an alkoxysilane and/or a partially hydrolyzed product thereof, (b) a fluorine-containing alkoxysilane and/or (e) an alkylalkoxysilane, (c) an alkoxide of a metal other than Si and/or a derivative thereof and (d) an organic solvent. The material for forming silica-base coated insulation films according to the present invention has a storage stability and also enables thick-layer formation. Silica-base insulation films obtained are transparent and uniform films and are those in which no defects such as cracks or pinholes are seen, also having a superior oxygen plasma resistance.</p>
申请公布号 EP0768352(A1) 申请公布日期 1997.04.16
申请号 EP19950923552 申请日期 1995.06.30
申请人 HITACHI CHEMICAL CO., LTD. 发明人 MATSUZAWA, JUN
分类号 C09D5/25;C09D183/14;H01L21/316;H01L21/768;(IPC1-7):C09D183/00;C09D185/00 主分类号 C09D5/25
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