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发明名称
TEST METHOD OF INTEGRATED CIRCUIT
摘要
申请公布号
JPH098090(A)
申请公布日期
1997.01.10
申请号
JP19950189670
申请日期
1995.06.21
申请人
IGARASHI MAKOTO
发明人
IGARASHI MAKOTO
分类号
G01R31/26;G01R31/30;G11C29/00;G11C29/56;H01L21/66;H01L21/8247;H01L27/115;(IPC1-7):H01L21/66
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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