CIRCUIT AND METHOD FOR SELF-TEST WITH BUILT-IN MEMORY ARRAY,申请号JP19960145266-传众专利搜索

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发明名称	CIRCUIT AND METHOD FOR SELF-TEST WITH BUILT-IN MEMORY ARRAY
摘要
申请公布号	JPH097397(A)	申请公布日期	1997.01.10
申请号	JP19960145266	申请日期	1996.06.07
申请人	INTERNATL BUSINESS MACH CORP <IBM>	发明人	ROBAATO DEIIN ADAMUSU;JIYON KONAA;GIYARETSUTO SUTEEBUN KOTSUHO;RUIJI TERUNUTSURO JIYUNIA
分类号	G11C29/12;G11C29/10;G11C29/36;(IPC1-7):G11C29/00	主分类号	G11C29/12
代理机构		代理人
主权项
地址

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