发明名称 Nonvolatile semiconductor memory device having a status register and test method for the same
摘要 An object of the present invention is to provided a semiconductor device that permits easy and efficient testing. A semiconductor device which is characterized in that the power supply for an output circuit is selectable between a normal power supply and an independent power supply provided independently of the normal supply.
申请公布号 US5566386(A) 申请公布日期 1996.10.15
申请号 US19950471526 申请日期 1995.06.06
申请人 FUJITSU LIMITED 发明人 KUMAKURA, SINSUKE;YAMAZAKI, HIROKAZU;WATANABE, HISAYOSHI;KASA, YASUSHI
分类号 G01R31/28;G11C5/14;G11C7/06;G11C16/06;G11C17/00;G11C29/00;G11C29/02;G11C29/24;G11C29/44;G11C29/50;H01L21/8247;H01L27/115;(IPC1-7):G11C5/14 主分类号 G01R31/28
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