发明名称 |
Nonvolatile semiconductor memory device having a status register and test method for the same |
摘要 |
An object of the present invention is to provided a semiconductor device that permits easy and efficient testing. A semiconductor device which is characterized in that the power supply for an output circuit is selectable between a normal power supply and an independent power supply provided independently of the normal supply. |
申请公布号 |
US5566386(A) |
申请公布日期 |
1996.10.15 |
申请号 |
US19950471526 |
申请日期 |
1995.06.06 |
申请人 |
FUJITSU LIMITED |
发明人 |
KUMAKURA, SINSUKE;YAMAZAKI, HIROKAZU;WATANABE, HISAYOSHI;KASA, YASUSHI |
分类号 |
G01R31/28;G11C5/14;G11C7/06;G11C16/06;G11C17/00;G11C29/00;G11C29/02;G11C29/24;G11C29/44;G11C29/50;H01L21/8247;H01L27/115;(IPC1-7):G11C5/14 |
主分类号 |
G01R31/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|