INTERFEROMETRIC METHOD AND APPARATUS TO MEASURE SURFACE TOPOGRAPHY,申请号EP19940924018-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	INTERFEROMETRIC METHOD AND APPARATUS TO MEASURE SURFACE TOPOGRAPHY
摘要
申请公布号	EP0722558(A1)	申请公布日期	1996.07.24
申请号	EP19940924018	申请日期	1994.07.25
申请人	ZYGO CORPORATION	发明人	BIEGEN, JAMES, F.
分类号	G01B9/02;G01B9/04;G01B11/24;G01B11/30;(IPC1-7):G01B9/02	主分类号	G01B9/02
代理机构		代理人
主权项
地址

您可能感兴趣的专利

Improvements in or relating to articulated conveyor belts

Liquid-cooled cylinder heads for internal combustion engines

Improvements in or relating to textile machines

Apparatus for applying strips to paper and like blanks

Needle bearing cage and its method of production

Improvements in and relating to television picture display devices

Improvements in apparatus for, and a method of forwarding and threading-in textile slivers

A new or improved lifting means for motor vehicle batteries and other objects of similar shape

A process for doping semi-conductor material with boron

Improvements in or relating to the cleaning of cloth

Improvements in liquefaction of gases

Polymerization process

Musical instrument

Improvements in and relating to hearing aids

Transmissions for powered vehicles

Improvements in or relating to the bending of profile members

New quinoline compounds

Method for preparaing heterocyclic nitrogen compounds and catalyst therefor

Improvements in or relating to rotary mechanisms, such as pumps, fluid motors and internal combustion engines