发明名称 Device for contactlessly testing passive routing substrates
摘要 A device for fault detecting passive routing substrates. Thermal behavior differences before and after a passive routing substrate is damaged are used. A batch of passive routing substrates is fault detected without running a functional test. In addition, the passive routing substrates are not contacted and are not damaged on detection. The device provides superior and precise detection before stacking the passive routing substrates.
申请公布号 US9380223(B2) 申请公布日期 2016.06.28
申请号 US201314101521 申请日期 2013.12.10
申请人 NATIONAL TSING HUA UNIVERSITY 发明人 Chien Jui-Hung;Yu Hao;Hsu Ruei-Siang;Lin Hsueh-Ju;Chang Shih-Chieh
分类号 G01N25/72;G01N1/00;G01R1/00;G06T7/00;H04N5/33 主分类号 G01N25/72
代理机构 Jackson IPG PLLC 代理人 Jackson IPG PLLC ;Jackson Demian K.
主权项 1. A device for fault detecting passive routing substrates without contacting the substrates, comprising a heater, said heater heating up a plurality of passive routing substrates; an image capture device connected with said heater and sequentially capturing a thermal image of each of said passive routing substrates to display temperature distribution of each said thermal image with different colors; a plurality of noise filters connected with said image capture device and separately filtering noise of said thermal images of said passive routing substrates; a plurality of differential filters connected with said noise filters, wherein every two neighboring differential filters compare corresponding neighboring two of said thermal images to obtain thermal behavior changing points in between to obtain a thermal behavior difference image of said two of said thermal images; and a comparison module connected with said differential filters and receiving said thermal behavior difference images, said comparison module comprising a first comparator and a second comparator connected with said first comparator, said first comparator comparing at least two of said thermal behavior difference images to obtain a good passive routing substrate according to distribution of said thermal behavior changing points between said at least two of said thermal behavior difference images, said second comparator comparing said thermal behavior difference image of said good passive routing substrate with each of the other ones of said thermal behavior difference images to estimate a yield of said passive routing substrates.
地址 Hsinchu TW