发明名称 SOI-field effect transistor und method for making the same
摘要 <p>Disclosed is a SOI-type semiconductor device having a monocrystalline silicon substrate, an insulator thin-film formed on the substrate, a monocrystalline silicon thin-film formed on the insulator thin-film, and a gate electrode formed on the monocrystalline silicon thin-film with inserting a gate insulating film therebetween, wherein the semiconductor device forming a thin-film transistor by the monocrystalline silicon thin-film including source, drain and channel regions, and the gate electrode serving as a control electrode, characterized in that the insulator thin-film has an aperture just below the gate electrode, and the monocrystalline silicon substrate has a protrusion extending into the aperture. The method for making the SOI-type semiconductor device is also disclosed. &lt;MATH&gt;</p>
申请公布号 EP0700096(A2) 申请公布日期 1996.03.06
申请号 EP19950113790 申请日期 1995.09.01
申请人 NEC CORPORATION 发明人 YOSHINO, AKIRA
分类号 H01L21/762;H01L21/20;H01L21/265;H01L21/336;H01L29/06;H01L29/10;H01L29/786;(IPC1-7):H01L29/78 主分类号 H01L21/762
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