TESTER FOR SEMICONDUCTOR DEVICE,申请号JP19940177871-传众专利搜索

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发明名称	TESTER FOR SEMICONDUCTOR DEVICE
摘要
申请公布号	JPH0845996(A)	申请公布日期	1996.02.16
申请号	JP19940177871	申请日期	1994.07.29
申请人	NEC CORP	发明人	FUJIMURA TAKUMA
分类号	G01R31/26;H01L21/66;(IPC1-7):H01L21/66	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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