发明名称 FORMING METHOD OF SEMICONDUCTOR DEVICE BUMP
摘要 <p>PURPOSE:To make bumps uniform in height by a method wherein solder is prevented frojn spreading at wet back. CONSTITUTION:A first process in which a plating power supplying current film 13 and a solder barrier Cr film 14 are successively sputtered on the pad electrode of a semiconductor device, a second process in which a solder barrier metal Cu layer 16 is formed on the pad electrode, a third process in which a mushroom-shaped solder plating 17 is formed on the pad electrode, and a fourth process in which the solder barrier Cr film 14 and the plating power supplying current film 13 are removed after a ball-shaped solder bump 18 is formed by melting the mushroom-shaped solder plating 17 are provided.</p>
申请公布号 JPH0845941(A) 申请公布日期 1996.02.16
申请号 JP19940181689 申请日期 1994.08.03
申请人 OKI ELECTRIC IND CO LTD 发明人 MURAISHI MITSUMASA
分类号 H01L21/60;H01L21/321;(IPC1-7):H01L21/321 主分类号 H01L21/60
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