发明名称 |
Corrosion resistant metal connection pattern prodn. |
摘要 |
Connection pattern is formed on a substrate by: (a) forming a connection layer on a substrate, selectively etching the layer using a halogen-contg. gas to form a pattern and then UV irradiating the pattern in a reducing species-contg. atmos. or in a fluorine-contg. gas; or (b) forming a connection layer on a substrate, applying a resist onto the layer, selectively etching the layer with a halogen-contg. gas using the resist as mask, forming a halogen-contg. protective layer on the sidewalls of the connection pattern and the resist, asking to remove the resist and then UV irradiating the pattern in a reducing species-contg. atmos. or in a fluorine contg. gas; or (c) carrying out process (b) but replacing the UV radiation step by a step of forming a carbide layer for covering the pattern surface. Also claimed are (i) appts. for forming a connection pattern on a semiconductor substrate; and (ii) a semiconductor device with a carbide layer covering the surface of a connection pattern on a substrate.
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申请公布号 |
DE4143499(C2) |
申请公布日期 |
1995.12.21 |
申请号 |
DE19914143499 |
申请日期 |
1991.05.06 |
申请人 |
MITSUBISHI DENKI K.K., TOKIO/TOKYO, JP |
发明人 |
OGAWA, TOSHIAKI, ITAMI, HYOGO, JP |
分类号 |
H01L21/02;H01L21/3213;(IPC1-7):H01L21/768;C23F4/00;H01L21/283;H01L21/467 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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