发明名称 |
Semiconductor memory device e.g. DRAM |
摘要 |
The memory device includes a number of MOSFETs, a lower insulation layer (12) on a substrate (11), and several memory electrodes. Provided with the MOSFETs are several capacitors. The insulation layer is deposited over the MOSFETs, leaving contact holes (13) free to expose the electrodes of the MOSFETs. The memory electrodes each have a conducting layer pattern (14') and a separator (17). The insulation layer overlaps the contact hole and the electrode providing electrical contact.
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申请公布号 |
DE19517344(A1) |
申请公布日期 |
1995.12.14 |
申请号 |
DE19951017344 |
申请日期 |
1995.05.11 |
申请人 |
HYUNDAI ELECTRONICS INDUSTRIES CO., LTD., ICHON, KYOUNGKI, KR |
发明人 |
KIM, DAE YOUNG, ICHON, KYUNGKI, KR |
分类号 |
H01L27/04;H01L21/02;H01L21/44;H01L21/822;H01L21/8242;H01L27/108;(IPC1-7):H01L27/105;H01L21/768;H01L21/311;H01L21/320 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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