发明名称 Semiconductor memory device e.g. DRAM
摘要 The memory device includes a number of MOSFETs, a lower insulation layer (12) on a substrate (11), and several memory electrodes. Provided with the MOSFETs are several capacitors. The insulation layer is deposited over the MOSFETs, leaving contact holes (13) free to expose the electrodes of the MOSFETs. The memory electrodes each have a conducting layer pattern (14') and a separator (17). The insulation layer overlaps the contact hole and the electrode providing electrical contact.
申请公布号 DE19517344(A1) 申请公布日期 1995.12.14
申请号 DE19951017344 申请日期 1995.05.11
申请人 HYUNDAI ELECTRONICS INDUSTRIES CO., LTD., ICHON, KYOUNGKI, KR 发明人 KIM, DAE YOUNG, ICHON, KYUNGKI, KR
分类号 H01L27/04;H01L21/02;H01L21/44;H01L21/822;H01L21/8242;H01L27/108;(IPC1-7):H01L27/105;H01L21/768;H01L21/311;H01L21/320 主分类号 H01L27/04
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