| 摘要 |
PURPOSE:To execute early investigation of the cause of a defective product and solve the problem in the manufacturing process quickly by a method wherein the traceability of a semiconductor device is maintained. CONSTITUTION:A manufacturing information recording fuse 4 by which the manufacturing information is recorded is provided in a memory chip 1. When a bit saving fuse 3 is cut off after a probe test, the manufacturing information recording fuse 4 is also cut off in the same process to record the manufacturing information such as a lot number. By providing a region in which the manufacturing information is recorded is provided in a semiconductor chip and facilitating the electrical readout of the manufacturing information through a lead-out wire the traceability of a semiconductor device in its manufacturing process and after the device is shipped to a customer can be improved. Therefore, if the defect of the semiconductor device is detected in the market or by a customer, the quick feedback to the manufacturing process can be performed and the labor for the investigation of the history of the semiconductor device can be also reduced.
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