INTEGRATED MICROPROCESSOR, COMPUTER DEVELOPMENT SYSTEM AND TEST METHOD OF INTEGRATED PROCESSOR

摘要

PURPOSE: To provide a debugging tool which tests components of an integrated microprocessor in various operation states. CONSTITUTION: In this integrated processor 10, one or more function units and stand-alone microprocessors are laid out on a common semiconductor die 25 and are connected by a common local bus 30. When receiving a test command signal generated on the outside of the integrated processor 10 from a host computer, a test circuit which is arranged on the die 25 and is connected to the common bus 30 generates a local bus cycle for stand-alone microprocessors or function units and/or devices attached to them in response to this command signal. In one example, the integrated processor 10 is built in the mother board of a target computer connected to the host computer by a JTAG bus or another test protocol bus.