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发明名称
METHOD FOR CREATING TEST PATTERN FOR HIGHLY EFFICIENT FAILURE DETECTION
摘要
申请公布号
JPH0755895(A)
申请公布日期
1995.03.03
申请号
JP19930198203
申请日期
1993.08.10
申请人
FUJITSU LTD
发明人
DEGUCHI CHIKAHIRO
分类号
G01R31/28;G01R31/3183;(IPC1-7):G01R31/318
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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