发明名称 |
METHOD OF CLEANING CVD REACTOR FOR MANUFACTURE OF POLYCRYSTALLINE SILICON |
摘要 |
<p>PURPOSE: To clean the inner surface of a chemical vapor deposition reactor that is used to manufacture silicon with a semiconductor grade by allowing carbon dioxide pellet to hit against a silicon deposit on the inner surface of the reactor that is used to form polycrystalline silicon by chemical vapor deposition. CONSTITUTION: A reactor 9 for cleaning is used to form polycrystalline silicon by chemically depositing a supply gas that is selected from a group consisting of silane and halosilane. Carbon dioxide gas is sent from a cylinder 1 to a pelletizer 2, where carbon dioxide gas is compressed and is formed into a solid dioxide carbon pellet. A solid carbon dioxide particle created by the pelletizer 2 is preferably in cylindrical form with 0.16-0.95 cm dimension. The carbon dioxide pellet hits against the inner surface of the reactor 9 and is discharged from a nozzle 4 toward the inner surface of the reactor 9 to eliminate adhered silicon, thus preventing the level of the contamination substance on the wall of the reactor from increasing.</p> |
申请公布号 |
JPH06216036(A) |
申请公布日期 |
1994.08.05 |
申请号 |
JP19920243209 |
申请日期 |
1992.09.11 |
申请人 |
HEMUROTSUKU SEMICONDUCTOR CORP |
发明人 |
DEIBITSUDO MAIKERU GOFUNETSUTO;MAAKU DAGURASU RICHIYAADOSON;YUUJIIN FURANSHISU BIIRUBII |
分类号 |
C23C16/44;B08B9/093;B24C1/00;B24C3/32;C23G5/00;H01L21/205;H01L21/302;H01L21/3065;(IPC1-7):H01L21/205 |
主分类号 |
C23C16/44 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|