发明名称 SEMICONDUCTOR MEMORY WITH METALLIC INTERCONNECTION LAYER OF THE SAME POTENTIAL AS THE WORD LINE AND CONNECTED THERETO OUTSIDE OF THE MEMORY CELL REGION
摘要 Memory cells (21), which serve as basic cells, are arranged in a matrix pattern. The memory cells (21) are each provided with a word line (W min ) which is integral with the gate electrode of a switch element (SW) and which is formed of polysilicon. A metallic interconnection layer (M) is arranged above the word line (W min ) and is applied with substantially the same potential as the word line (W min ). The metallic interconnection layer (M) and the word line (W min ) are connected together via through-holes (23A). The through-holes (23A) are formed in through-hole cells (23), which also serve as basic cells. The through-hole cells (23) and the memory cells (21) are arranged such that the number of rows of the former and the number of rows of the latter are in the ratio of one to at least two.
申请公布号 EP0421168(A3) 申请公布日期 1994.07.13
申请号 EP19900117656 申请日期 1990.09.13
申请人 KABUSHIKI KAISHA TOSHIBA;TOSHIBA MICRO-ELECTRONICS CORPORATION 发明人 TAKASE, SHINSUKE, C/O INTELLECTUAL PROPERTY DIV.;HASHIMOTO, HISASHI, C/O INTELLECTUAL PROPERTY DIV.;TANAKA, YUTAKA, C/O INTELLECTUAL PROPERTY DIV.
分类号 G11C17/12;H01L21/82;H01L27/10;H01L27/112;H01L27/118 主分类号 G11C17/12
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