发明名称 |
MANUFACTURE OF SEMICONDUCTOR MEMORY |
摘要 |
PURPOSE:To increase the effective surface area of the storage node of a capacitor used in a DRAM cell. CONSTITUTION:A recessing and projecting surface 7 is formed on the surface of a polycrystalline silicon thin film 3 which becomes the lower electrode 3 of a capacitor by performing reactive etching 6 having a selection ratio of >=3 against phosphate glass 5 on the thin film 3 by utilizing the glass 5 formed on the surface of the thin film 3 with an uneven film thickness as a kind of etching mask at the time of introducing phosphorus into the thin film 3. |
申请公布号 |
JPH06125053(A) |
申请公布日期 |
1994.05.06 |
申请号 |
JP19920297702 |
申请日期 |
1992.10.09 |
申请人 |
NIPPON STEEL CORP |
发明人 |
KAWAMURA KOICHIRO |
分类号 |
H01L21/28;H01L21/02;H01L21/302;H01L21/3065;H01L21/822;H01L21/8242;H01L27/04;H01L27/10;H01L27/108 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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