发明名称 MANUFACTURE OF SEMICONDUCTOR MEMORY
摘要 PURPOSE:To increase the effective surface area of the storage node of a capacitor used in a DRAM cell. CONSTITUTION:A recessing and projecting surface 7 is formed on the surface of a polycrystalline silicon thin film 3 which becomes the lower electrode 3 of a capacitor by performing reactive etching 6 having a selection ratio of >=3 against phosphate glass 5 on the thin film 3 by utilizing the glass 5 formed on the surface of the thin film 3 with an uneven film thickness as a kind of etching mask at the time of introducing phosphorus into the thin film 3.
申请公布号 JPH06125053(A) 申请公布日期 1994.05.06
申请号 JP19920297702 申请日期 1992.10.09
申请人 NIPPON STEEL CORP 发明人 KAWAMURA KOICHIRO
分类号 H01L21/28;H01L21/02;H01L21/302;H01L21/3065;H01L21/822;H01L21/8242;H01L27/04;H01L27/10;H01L27/108 主分类号 H01L21/28
代理机构 代理人
主权项
地址