发明名称 |
THIN FILM TRANSISTOR AND ITS PRODUCTION |
摘要 |
<p>PURPOSE:To produce a thin film transistor without causing damage such as pinholes to an insulating film at a part at which a source electrode and a gate electrode cross by etching a semiconductor layer and an impurity semiconductor layer while hiding a gate electrode circuit,, forming the source electrode and then removing the unnecessary parts of the semiconductor layer and the impurity semiconductor layer. CONSTITUTION:A gate electrode 2 is formed on a glass substrate 1 by patterning a film, and a gate insulating layer 3, a semiconductor layer 4 and a protective insulator layer 9 are formed on the substrate 1. The insulator layer 9 is patterned into a prescribed shape and an impurity semiconductor layer 6 is formed on the patterned layer 9. The impurity semiconductor layer 6 and the semiconductor layer 4 are simultaneously patterned and a transparent electrode 5 is formed by patterning a film. An electrode metal film is further formed and patterned to form a source electrode 7 and a drain electrode 8 and then the unnecessary parts of the impurity semiconductor layer 6 and the semiconductor layer 4 are removed by etching with the electrodes 7, 8 as a mask. The objective thin film transistor is produced.</p> |
申请公布号 |
JPH05323369(A) |
申请公布日期 |
1993.12.07 |
申请号 |
JP19920127167 |
申请日期 |
1992.05.20 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
KOMORI KAZUNORI;KOBAYASHI IKUNORI;TAKEDA MAMORU |
分类号 |
G02F1/136;G02F1/1368;H01L21/336;H01L27/12;H01L29/78;H01L29/786;(IPC1-7):G02F1/136;H01L29/784 |
主分类号 |
G02F1/136 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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