| 摘要 |
A high resolution infrared densitometer system is described which comprises an intense thermal light source, an optical system for projecting first and second images of the light source along respective parallel first sample and second reference optical axes, adjustable optical attenuators for selectively balancing the light intensity of the images projected along the sample and reference axes at selected optical density, a spectrometer for filtering background radiation from the projected images except for a selected wavelength, and a detector for measuring intensities of the filtered projected images. A method for making optical density measurements is described.
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