The method involves the use of microinstruction sequences combined together to form a self-test microprogram. At the start of the self-test initialisation is performed. The microprogram is run at least once during the self-test. For multiple runs of the microprogram the results of each previous run are used as the data basis for each successive run. Signatures are formed for fault evaluation purposes. USE/ADVANTAGE - Enables self-testing of microprogrammed processors without additional hardware required on silicon chip whose surface area is thus reduced.
