发明名称 TEST SYSTEM FOR INFORMATION PROCESSOR
摘要 PURPOSE:To contrive the efficient test system by excluding the score obtained at an error occurring point out of an instruction table when the score exceeds a prescribed level after controlling the scores by a test device for each test instruction. CONSTITUTION:An information processor 14 consists of an operational processor 15 and a main storage 16. The processor 15 carries out an instruction train stored in the storage 16 based on the data on a register of the processor 15 and the data on the storage 16. A test device 17 is connected to the processor 14 and can set and read the data to the register of the processor 15 and the storage 16. Furthermore the device 17 can monitor the start of the instruction train of the storage 16 and the end of execution of the instruction train. The device 17 contains an external storage device which stores a test program, a printer or the like which outputs the error information to an input/output device to make an operator start the test program and check the test result, etc.
申请公布号 JPH05158726(A) 申请公布日期 1993.06.25
申请号 JP19910323528 申请日期 1991.12.09
申请人 NEC CORP 发明人 MIKOYAMA SHIGEZO
分类号 G06F11/22;G06F11/26 主分类号 G06F11/22
代理机构 代理人
主权项
地址