发明名称 Strain measurement pick=up for weighing appts. - operates on interferometer principle, and amplifies change in optical guide length by multiple reflections of beam
摘要 Strain is measured with an interferometer whose measurement beam (4) is guided into an elastic light-guide (14) subject to changes of shape corresp. to the length or distance variation to be measured. The effect is amplified by multiple reflections of the beam (4) between two parallel mirrors (10,11) before and during its return (15) to the interferometer. The light-guide (14) may be a thin silicon chip similar to that (16) in which the interferometer is formed. ADVANTAGE - Signal-to-noise ratio of interferometer is good, with intensity of measurement beam largely independent of its length.
申请公布号 DE4132113(A1) 申请公布日期 1993.04.01
申请号 DE19914132113 申请日期 1991.09.26
申请人 SIEMENS AG, 8000 MUENCHEN, DE 发明人 BEETZ, BERNHARD, DR.-ING., 7460 BALINGEN, DE;FRITZ, HARALD, DIPL.-ING., 7517 WALDBRONN, DE
分类号 G01B9/02;G01B11/16;G01D5/26;G01G3/12 主分类号 G01B9/02
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