发明名称 |
A sputtering apparatus. |
摘要 |
<p>The sputtering apparatus which can be inserted in a continous manufacturing line comprises judging means (51) for judging whether or not a normal thin film has been satisfactorily deposited on the surface of a substrate to be processed in a film deposition apparatus (3). The apparatus comprises necessary condition-determining means for determining conditions necessary for depositing a normal thin film on the surface of the substrate to be processed, executed result-detecting means for detecting the results of a thin film deposition process, by sensing e.g. the pressure in a vacuum chamber or the waveform of discharge output power supplied from a discharge power source, comparing means for comparing the executed results detected by the executed result-detecting means with the necessary conditions determined by the necessary condition-determining means, and judging means (51) for judging immediately after the sputtering process whether or not the thin film-deposition process has been satisfactorily performed on the basis of the comparison results produced from the comparing means. <IMAGE></p> |
申请公布号 |
EP0497066(A1) |
申请公布日期 |
1992.08.05 |
申请号 |
EP19910402591 |
申请日期 |
1991.09.27 |
申请人 |
SONY CORPORATION;KABUSHIKI KAISHA TOKUDA SEISAKUSHO |
发明人 |
SHIMOSE, YUICHIRO;IKEDA, JIRO |
分类号 |
C23C14/34;C23C14/54;H01J37/32 |
主分类号 |
C23C14/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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