发明名称 METHOD FOR FLATTING PHOTORESISTS WITH ULTRAVIOLET RAYS
摘要 The photoresist layer is planarized with ultraviolet radiating for a few second. The photoresist containing a sensitizer, resin, solvent, and another additives is transformed into the ketene by radiating the characteristic wave (350-450nm) of ultraviolet, which is finally transformed into indenecarboxylic acid by reaction with water of resist. This method provides the advantage for reducing the process time in multilevel resist lithography.
申请公布号 KR910006043(B1) 申请公布日期 1991.08.12
申请号 KR19890008303 申请日期 1989.06.16
申请人 HYUNDAI ELECTRONICS CO.,LTD. 发明人 MUN SUNG-CHAN;BOK CHOI-KYU;LEE YONG-SOK
分类号 G03F7/26;(IPC1-7):G03F7/26 主分类号 G03F7/26
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