发明名称 X-RAY ANALYSIS
摘要 PURPOSE:To improve the efficiency of measurement and to prevent the skipping of the detection of characteristic X-rays by automatically lowering the tube current of an X-ray source when a measuring wavelength enters a wavelength region stored in a memory device in the case of a sample measurement. CONSTITUTION:The range of the existence wavelength of the characteristic X-rays is detected by previously executing wavelength scanning without a sam ple over the entire area of the measurable wavelength range of a measuring instrument and is previously stored into a memory device. The measuring instru ment is so constituted that the tube current of the X-ray source is automatically lowered when the measured wavelength enters the wavelength area stored in the memory device in the case of the sample measurement. Then existence position of the characteristic X-ray of the X-ray source is previously measured and stored in the memory device and, therefore, there is no need for making preliminary measurement at every measurement and the time over the entire part of the measurement is shortened. Since the measurement is intended to retrieve only the presence or absence of the peak of the characteristic X-ray, the overlooking of the strong characteristic X-ray peak by the saturation of the X-ray detector is obviated and the erroneous measurement is averted.
申请公布号 JPH0348758(A) 申请公布日期 1991.03.01
申请号 JP19890185630 申请日期 1989.07.17
申请人 SHIMADZU CORP 发明人 TAKEUCHI YUKA
分类号 G01T1/36;G01N23/087 主分类号 G01T1/36
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