Integrated circuit comprising separate function modules - each with own test circuit having pick=up path to collect test data from lead conducting output-input signals

摘要

The pick-up paths (a-3d) of the test circuits of the modules (2a,2b) serve for checking and output of test result data. The test circuit has a buffer (4a) with three output conditions to control the result of the test output data from the pick-up path to an input-output lead. A selector circuit (5a) allows selective activation of the buffer. Al the selector circuits of the integrated circuit are switched in series to form together a shift register. A selection signal of the serial data is delivered to the latter so that the test output signal of each pick-up path is selectively extracted to the input output lead. USE/ADVANTAGE - Suitable for storing in hierachic library. Individual testing possible without reqg. unitary programming of the address circuit.