发明名称 Reverse staggered type silicon thin film transistor
摘要 A reverse staggered type silicon thin film transistor includes a substrate having a gate electrode; a gate insulating layer on the substrate and the gate electrode, the gate insulating layer having a transistor-forming portion; a lower layer silicon film on the transistor-forming portion of the gate insulating layer and in contact therewith, the lower layer silicon film being formed at a first temperature and with a first thickness; an upper layer silicon film formed on the transistor-forming portion of the gate insulating layer at a second temperature which is lower than the first temperature and with a second thickness greater than the first thickness; and n-type silicon layer on the upper layer silicon film and in contact therewith; a source electrode on the n-type silicon layer; and a drain electrode on the n-type silicon layer.
申请公布号 US4979006(A) 申请公布日期 1990.12.18
申请号 US19890358035 申请日期 1989.05.26
申请人 SEIKOSHA CO., LTD.;NIPPON PRECISION CIRCUITS LTD. 发明人 TANAKA, SAKAE;WATANABE, YOSHIAKI;SHIRAI, KATSUO;OGIWARA, YOSHIHISA
分类号 H01L27/12;G02F1/136;G02F1/1368;H01L29/78;H01L29/786 主分类号 H01L27/12
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