MEMORY SYSTEM FOR IC TESTER,申请号JP19890100680-传众专利搜索

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发明名称	MEMORY SYSTEM FOR IC TESTER
摘要
申请公布号	JPH02280072(A)	申请公布日期	1990.11.16
申请号	JP19890100680	申请日期	1989.04.20
申请人	SEIKO EPSON CORP	发明人	GOMI KAZUHIRO
分类号	G01R31/317;G06F11/22	主分类号	G01R31/317
代理机构		代理人
主权项
地址

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