| 摘要 |
PURPOSE:To attain the exact verification of failure processing function by executing a function test in a function testing means synchronously with the supplying operation of a dummy failure signal to the processing means of a device to be tested. CONSTITUTION:In correspondence to the dummy failure signal which is outputted from a dummy failure informing means 121, the failure processing of a processing means 111 in the device to be tested is activated. When the failure processing by the processing means 111 is activated, the function test is executed by a function testing means 131. By executing the function test in the function testing means 131 synchronously with the supplying operation of the dummy failure signal to the means 111 of the device to be tested, the exact verification of the failure processing function can be executed. |
