发明名称 SEMICONDUCTOR DEVICE
摘要 PURPOSE:To avoid corrosion of a wiring and degradation of a bonding strength by a method wherein a bonding pad is covered with a bonding ball over its whole surface and the bonding ball is bonded to a dummy pattern. CONSTITUTION:The shape of a bonding pad 3 which is formed on the surface of a semiconductor chip 1 and is not covered with a protective film 4 is so formed as to have its outline inside the bonding surface of a bonding ball 6 which is provided at the lower end of a bonding wire 5 bonded to the upper surface of the bonding pad 3. Further, a dummy pattern 7 which can be jointed with the bonding ball 6 is provided around the bonding pad 3 so as to make the bonding ball 6 cover the whole surface of the bonding pad 3 and a part of the dummy pattern 7. With this constitution, the corrosion of a wiring 2 and the degradation of a bonding strength can be avoided.
申请公布号 JPH02129936(A) 申请公布日期 1990.05.18
申请号 JP19880283354 申请日期 1988.11.09
申请人 TOSHIBA CORP 发明人 SUGIZAKI YOSHIAKI
分类号 H01L21/60 主分类号 H01L21/60
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