发明名称 AUTOMATIC TEST SYSTEM
摘要 PURPOSE:To shorten the test time of a service processor arm by comparing 2nd received answer data with 1st answer data read out of a storage part and detecting a coincidence between the both. CONSTITUTION:The storage part 6 is stored previously with a command and its 1st answer data from a service processor(SVP) 1 and also stored with the 1st transmission/reception time difference of the both. Then, an automatic transmission part 8 sends the command stored in the storage part 6 to the SVP1, which sends the 2nd answer data back in response from the SVP1. A comparing and deciding means 9 informs an operator console 3 of error occurrence unless the difference between 2nd and 1st transmission/reception time differences by the automatically sent command is smaller than a predetermined constant value. A coincidence detecting means 10, on the other hand, inputs the detection output of the error occurrence to the operator console 3 when the 1st and 2nd answer data do not coincide with each other. Consequently, the firmware of the SVP1 is tested automatically in a short time.
申请公布号 JPH02108134(A) 申请公布日期 1990.04.20
申请号 JP19880261179 申请日期 1988.10.17
申请人 FUJITSU LTD 发明人 ISHIHARA KENJI
分类号 G06F11/22 主分类号 G06F11/22
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