首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
MEASURING INSTRUMENT FOR CHARACTERISTIC OF SEMICONDUCTOR WAFER
摘要
申请公布号
JPH01313781(A)
申请公布日期
1989.12.19
申请号
JP19880146371
申请日期
1988.06.14
申请人
NEC CORP
发明人
TAKATSUKI KUNIO
分类号
G01R31/26;H01L21/66
主分类号
G01R31/26
代理机构
代理人
主权项
地址
您可能感兴趣的专利
IMPIANTO PNEUMATICO DI SICUREZZA PER SERRAMENTI A CHIUSURA E APERTURA AUTOMATICHE
MANUFACTURE OF 1,2-DICHLOROETHANE
POWER STEERING GEAR FOR VEHICLE
SEMIHARD MAGNETIC ALLOY
PLAY CAR ASSOCIATED WITH INTERNAL-COMBUSTION ENGINE
ELECTROMAGNETIC SERVO-BRAKE FOR AUTOMOBILE
SADDLED TYPE FOUR-WHEELED CAR
REMOVAL OF IRON FROM LIXIVIATION
TOOL HOLDER
SLIDING CONTACT MATERIAL
MULTI-SPINDLE COOLING DEVICE
MULTI-SPINDLE COOLING DEVICE
MULTI-SPINDLE COOLER
MULTI-SPINDLE COOLING DEVICE
SPUTTERING DEVICE
CORRECTION METHOD OF CENTER OFFSET BETWEEN UPPER AND LOWER SHAFTS FOR BUCKET ELEVATOR
MEDIUM FEEDING MECHANISM
HAIRLINE WORKING DEVICE
SOLID TYRE
PAPER-SHEET TRANSFERRING APPARATUS
