| 摘要 |
Apparatus for automatically testing electronic circuits (16) includes an AC measurement system (32, 22) and a time measuring circuit (18) for counting clock pulses provided between stop and start event edges presented to it. Two independent input selectors (54, 56) each selectively connect one of a plurality of its inputs to the time measuring circuit, and a plurality of local timing comparators (26, 28) generate an event edge upon receiving a signal crossing a threshold value. Also disclosed are making time measurements of signals at digital and analog pins using local comparators connected to input selectors over deskewed transmission paths and connecting a local comparator (68, 70) to the filter output of an AC measurement instrument (62, 63); and a differential input selector (Fig 2 not shown) for selectively connecting one of a plurality of differential inputs (118) to a differential output (122). <IMAGE> |
