发明名称 TEST SYSTEM FOR SEQUENCE CONTROL PROGRAM
摘要 <p>PURPOSE:To improve the efficiency of a test work by obtaining the input of an imaged test as a moving condition to the next test index when there is a program not to be prepared in the programs to belong to a low order hierarchy during the test. CONSTITUTION:A process control system has a processor 10, an external storage 10, a man-machine interface device 14 and a process input and output device 16 and this system is connected to a plant facility 20. This processor 10 is composed of a microcomputer to have a CPU, a ROM and a RAM, etc., and the processor has a CRT display. In a master sequence control system, a programming and supervision are approached from the high order hierarchy and the low order hierarchy in the program. Thus, when there is the unprepared program in the programs to belong to the lower order hierarchy than the program for master sequence during the test, the input of the test result at a time this program is imaged to be prepared is stimulated.</p>
申请公布号 JPH01136212(A) 申请公布日期 1989.05.29
申请号 JP19870295529 申请日期 1987.11.24
申请人 HITACHI LTD 发明人 KAWAGUCHI KOICHI;SATO TETSUO
分类号 C08F2/00;G05B19/04;G05B19/048;G05B19/05;G05B23/02;G06F11/28 主分类号 C08F2/00
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