发明名称 |
Combined thermal analyzer and x-ray diffractometer |
摘要 |
Scientific apparatus and a method are described for observing simultaneously both structural and thermodynamic properties of materials. An X-ray diffractometer and a thermal analyzer and mounted to cooperate and coact on the same sample and to complete a meaningful analysis in a very few minutes. The diffractometer is equipped with a rapid position-sensitive detector connected to a multichannel analyzer to record and display X-ray diffraction data from the sample over an angle of 20 DEG (two theta) or more. The thermal analyzer is preferably a differential scanning calorimeter. By correlating X-ray diffraction and thermal data taken simultaneously while the sample is passing through a range of temperatures and/or environments, structural changes corresponding to thermal events can be identified and elucidated.
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申请公布号 |
US4821303(A) |
申请公布日期 |
1989.04.11 |
申请号 |
US19870105769 |
申请日期 |
1987.10.06 |
申请人 |
THE DOW CHEMICAL COMPANY |
发明人 |
FAWCETT, TIMOTHY G.;HARRIS, JR., WILLIAM C.;NEWMAN, ROBERT A.;WHITING, LAWRENCE F.;KNOLL, FRANK J. |
分类号 |
G01N23/207;G01N25/48;(IPC1-7):G01N23/20 |
主分类号 |
G01N23/207 |
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