发明名称 PATTERN DETECTING APPARATUS
摘要 PURPOSE:To ensure the detection of the slant angle of the side end surface of a pattern simply without destructing a sample, by moving an aperture part on an image forming lens, and detecting light which passes the aperture part lens and is reflected by the side end surface of the pattern. CONSTITUTION:An aperture part 2 is moved in the directions of arrows A. At this time, the detected light intensity in a photodetector 3 is changed with the change in the incident angle of incident light accompanying the movement of the aperture part. One peak, where the detected light intensity I shows the maximum value I0 at a moving position X0, is formed. Said peak is obtained when the intensity of the reflected light becomes the maximum value, i.e., the angle of the reflected light with respect to a side end surface E of a pattern P becomes 90 deg.. The moving position X of the aperture part 2 and the detected light intensity I of the photodetector 3 are sent to an operation part 4. A slant angle theta of the side end surface E is computed from the value of the moving position when the detected light in intensity I shows the maximum value in the operating part.
申请公布号 JPS6475906(A) 申请公布日期 1989.03.22
申请号 JP19870232667 申请日期 1987.09.18
申请人 FUJITSU LTD 发明人 ANDO MORITOSHI;IWATA SATOSHI
分类号 G01B11/24;G01B11/26;G01N21/88;G01N21/956;H01L21/027;H01L21/30;H01L21/66 主分类号 G01B11/24
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