发明名称 High voltage capacitor for integrated circuits
摘要 High voltage capacitors particularly suited for a BiCMOS process are formed in conjunction with prior art low voltage capacitors. In a first embodiment of a high voltage capacitor, an N+ region (66) is used as a first plate of the capacitor. The thermal gate oxice layer (48) used in conjunction with the MOS transistors (22,24) is also grown over the N+ region (66). Since the thermal oxide growth over the N+ region is accelerated, a thicker oxide region will be formed. A polysilicon plate (70) is formed over the thick oxide region (68) at the same time the first plate (12) of the low voltage capacitor (10) is formed. Alternatively, a nitride layer (18) may be formed over the thick oxide layer (68). The nitride layer (18) is also used in the formation of a low voltage capacitor (10).
申请公布号 US4805071(A) 申请公布日期 1989.02.14
申请号 US19870126442 申请日期 1987.11.30
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 HUTTER, LOUIS N.;ERDELJAC, JOHN P.
分类号 H01L27/04;H01L21/02;H01L21/334;H01L21/822;H01L21/8249;H01L27/06;H01L27/08;H01L29/94;(IPC1-7):H01G4/10;H01G7/00;H01L27/02 主分类号 H01L27/04
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