发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE:To reduce the noise of a capacity coupling, suffering from an adjacent bit line by providing a dummy column select line, fixed to a constant voltage, between the adjacent column select lines, and forming the column and the dummy select lines by a wiring layer, different from the bit line. CONSTITUTION:A semiconductor memory device consists of plural word lines WLA1, WLB1, bit lines BLA0-BLA3, the inverse of BLA0- the inverse of BLA3, BLB0-BLB3, the inverse of BLB0- the inverse of BLB3, memory cell array blocks A, B consisting of memory cell groups, positioned at the points of intersection of above-mentioned lines, the column select lines CS0, CS1, the dummy column select lines DCS0, DCS1, fixed at a grounding potential. By providing the dummy column select line (DCS line), the capacity of the bit line comes as follows, C1+C2+C3' C1+C2+C3'+C4 and it increases strictly, but because the CS line and the DCS line are formed by the wiring layer, different from the bit line, it can be suppressed below a level, not to cause a trouble for a practical use, and the unbalance of a signal read-out quantity can be canceled as well.
申请公布号 JPS63304496(A) 申请公布日期 1988.12.12
申请号 JP19870139433 申请日期 1987.06.03
申请人 MITSUBISHI ELECTRIC CORP 发明人 MATSUDA YOSHIO;FUJISHIMA KAZUYASU;HIDAKA HIDETO
分类号 G11C11/401;G11C11/34;G11C11/409;H01L21/8242;H01L27/10;H01L27/108 主分类号 G11C11/401
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