发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF
摘要 PURPOSE:To prevent abnormal etching in formation of a via hole and to prevent disconnection in a metal layer formed on the surface of the via hole, by previously forming a first metal layer selectively within a contact hole provided in an etch stopping insulation layer. CONSTITUTION:An etch stopping insulation layer 2 having a window hole 2a is formed on the surface of a GaAs substrate 1, and a first metal layer 4 is formed in the window hole 2a. Then, a second metal layer 5 for providing interconnections, electrodes etc of an electric circuit is formed thereon. The substrate 1 is wet etched from the rear face thereof so that a via hole 1a is formed and the first metal layer 4 is exposed. The exposed surface of the first metal layer 4 as well as the surface of the via hole 1a are totally covered with a plated metal layer 6 for supplying power, which is then covered with a third metal layer 66. In this manner, abnormal etching or overhang within the via hole can be prevented effectively. Accordingly, disconnection in the metal layer 6 on the surface of the via hole can be prevented.
申请公布号 JPS63126249(A) 申请公布日期 1988.05.30
申请号 JP19860272278 申请日期 1986.11.15
申请人 MITSUBISHI ELECTRIC CORP 发明人 OZAKI KATSUYA;AONO KOJI
分类号 H01L23/52;H01L21/3205 主分类号 H01L23/52
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