发明名称 |
Semiconductor memory systems and methods of operating them. |
摘要 |
<p>A self-testing and self-repairing memory system (3-15) is presented as well as a method for using it and a method for making it. This memory system is constructed from memory chips (3-1 that have passed an abbreviated wafer probe test. After the memory system (3-15) is assembled, it tests itself to locate defective memory cells (3-5). The memory system (3-15) may decide to correct these defective memory cells (3-5) or it may decide to correct them using an error correction code engine (3-3). This memory system (3-15) tests itself during field use to locate defective memory cells. Once these defective memory cells (3-5) are located, the memory system (3-15) uses the error correction code engine (3-3) to correct these defective memory cells (3-5). When the error correction code engine (3-3) becomes overburdened with defective memory cells (3-5), then the memory system (3-15) replaces these defective memory cells (3-5).</p> |
申请公布号 |
EP0268401(A2) |
申请公布日期 |
1988.05.25 |
申请号 |
EP19870309700 |
申请日期 |
1987.11.03 |
申请人 |
HEWLETT-PACKARD COMPANY |
发明人 |
EATON, STEVEN GLEN;KESHNER, MARVIN S.;HANLON, LAWRENCE R. |
分类号 |
G06F11/00;G06F11/10;G06F11/20;G11C11/401;G11C29/00;G11C29/12;G11C29/42;G11C29/44;G11C29/56 |
主分类号 |
G06F11/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|